• DocumentCode
    2598632
  • Title

    Automatic calibration of Time to Digital Converter

  • Author

    Young-Ho Lee ; Kwang-Hee Lee ; Jong-wan Seo ; Dong-Hwan Lim ; Sang-Hwa Lee ; Jin-Myoung Kim ; Tae-Yong Kuc ; Seung-Min Baek ; Ki-Min Lee ; Jung, S.J. ; Seung-Ho Baeg ; Baeg, M.H.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea
  • fYear
    2009
  • fDate
    5-7 May 2009
  • Firstpage
    1012
  • Lastpage
    1017
  • Abstract
    Due to its restricted usage and accuracy in measuring extremely short interval of time, TDC (time to digital converter) embedded measurement devices are relatively expansive. Even if new applications are being developed in daily life as well as in industry, the cost condition of TDC based measurement systems needs to be improved. To reduce the deployment cost on a commercial scale, analogue interpolation method is preferred to digital interpolation method for most of TDCs. However, the analogue interpolation method does not provide robustness to temperature variation and non-uniformity of parts, which results in difficulty in maintaining the expected repeatability. In this paper, an auto-calibration method is proposed for robust operation and precise measurement of TDC under the condition of temperature variation and lack of parts uniformity.
  • Keywords
    analogue-digital conversion; calibration; interpolation; measurement systems; TDC precise measurement; analog-digital conversion; analogue interpolation method; automatic calibration; digital interpolation method; embedded measurement devices; high-speed ADC; measurement systems; time-to digital converter; Calibration; Costs; Interpolation; Measurement errors; Pulse measurements; Robustness; Space vector pulse width modulation; Temperature measurement; Temperature sensors; Time measurement; Automatic Calibration; Passive Component; Temperature Compensation; Time to Digital Converter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-3352-0
  • Type

    conf

  • DOI
    10.1109/IMTC.2009.5168601
  • Filename
    5168601