Title :
Φ-test: Perfect hashed index test for test response validation
Author_Institution :
General Electric Corp. R&D, Schenectady, NY, USA
Abstract :
A scheme called Φ-test for checking the fidelity of test responses generated by a specially tailored sequence of test inputs is described. Φ-test, which performs the checks without storing the test responses in any manner, can be used for fault diagnosis and isolation in (1) embedded combinational or sequential logic, and (2) a system of units connected via a bus. Unlike signature analysis, Φ-test flags the offending values in case of discrepancy, thereby exposing the test inputs (and by implication, the devices) that generated them
Keywords :
built-in self test; combinational circuits; fault diagnosis; logic testing; sequential circuits; Phi-test; built-in test methodology; embedded combinational logic; embedded sequential logic; fault diagnosis; fault isolation; hashed index test; test inputs; test response validation; Circuit testing; Counting circuits; Fault diagnosis; Hardware; Logic devices; Logic testing; Research and development; Rivers; Sequential analysis; System testing;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-4230-0
DOI :
10.1109/ICCD.1993.393309
