• DocumentCode
    2598666
  • Title

    Influence of error correlations on the signature analysis aliasing

  • Author

    Leveugle, R. ; Delord, X. ; Saucier, G.

  • Author_Institution
    Inst. Nat. Polytech. de Grenoble/CSI, France
  • fYear
    1993
  • fDate
    3-6 Oct 1993
  • Firstpage
    584
  • Lastpage
    587
  • Abstract
    Signature analysis is often used in the test area to reduce the amount of information to check. The drawback of this compaction is its non-zero aliasing probability, i.e. the possibility to obtain a correct signature in spite of errors in the compacted words. Up to now, the studies on aliasing have focused on BIST applications and do not consider correlations between errors in two compacted words. However, online test methods also use signature analysis. The reported experiments show that, in this context and for some types of faults, the existing correlations have a noticeable impact on the aliasing probability. Further theoretical studies taking into account these correlations are therefore required to model the aliasing observed at each compaction step. It also seems that checking a signature in the middle of a linear block of instructions is better than checking it just before or after a branching instruction
  • Keywords
    built-in self test; computer testing; fault diagnosis; integrated circuit testing; logic testing; virtual machines; BIST applications; compacted words; error correlations; online test methods; signature analysis aliasing; Analytical models; Built-in self-test; Compaction; Control systems; Error correction; Information analysis; Linear feedback shift registers; Monitoring; Polynomials; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-4230-0
  • Type

    conf

  • DOI
    10.1109/ICCD.1993.393310
  • Filename
    393310