• DocumentCode
    2598760
  • Title

    Electrohydrodynamic instability of charged drops at external affects

  • Author

    Bologa, Al.M. ; Bologa, An.M.

  • Author_Institution
    Inst. of Power Eng., Acad. of Sci. of Moldova, Chisinau, Moldova
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    777
  • Abstract
    Electrohydrodynamic instability of charged droplets is the phenomenon observed when the electrostatic forces acting on the charged drop is larger than the surface tension force. In the double phase gel-liquid system, a charged droplet is characterized by hydrogasodynamic and electrohydrodynamic instability. Aerodynamic forces and external electric field determine charged droplet geometry changing. It is shown that naturally charged droplets obviously do not reach their electrohydrodynamic instability. The influence of external affects on droplets charged in external electric field is analyzed. The process of heat and mass transfer in the double phase gas-liquid system is one of the main factors that influences charged droplet electrohydrodynamic instability. The results of influence of liquid and gas temperature and pressure on charged droplet electrohydrodynamic instability are presented
  • Keywords
    drops; electrohydrodynamics; flow instability; heat transfer; mass transfer; surface tension; two-phase flow; aerodynamic forces; charged droplet; charged droplet geometry; charged drops; double phase gas-liquid system; double phase gel-liquid system; electrohydrodynamic instability; electrostatic forces; external affects; external electric field; gas temperature; heat transfer; hydrogasodynamic instability; liquid temperature; mass transfer; naturally charged droplets; surface tension force; Aerodynamics; Aerosols; Electrohydrodynamics; Electrostatics; Geometry; Heat transfer; Power engineering; Stability; Surface tension; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
  • Conference_Location
    Rome
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-6401-5
  • Type

    conf

  • DOI
    10.1109/IAS.2000.881918
  • Filename
    881918