• DocumentCode
    2598789
  • Title

    Dynamic sequencing of test programs

  • Author

    Levy, Arthur ; Pizzariella, John

  • Author_Institution
    Harris Corp., Syosset, NY, USA
  • fYear
    1990
  • fDate
    17-21 Sep 1990
  • Firstpage
    93
  • Lastpage
    97
  • Abstract
    A novel ATE (automatic test equipment) test program development/execution concept employed at Harris is discussed, Test program sets are constructed as a collection of atomic tests (i.e., independent, totally encapsulated tests) whose sequence is determined by a test manager with adaptive reasoning. The tests can be independently constructed and compiled, allowing for more parallel development and reduced maintenance costs. Communication between tests is achieved through a common data storage, and the setup conditions are reconciled by a single setup test module whose actions are directed by a state vector. The test manager employs experiential data to adjust relative failure probabilities in optimally sequencing the atomic tests
  • Keywords
    automatic test equipment; economics; failure analysis; modules; probability; ATE; atomic tests; automatic test equipment; dynamic sequencing; optimal sequencing; parallel development; reduced maintenance costs; relative failure probabilities; single setup test module; test manager; Aerospace electronics; Automatic test equipment; Automatic testing; Costs; Design for testability; Government; Hardware; Manuals; Memory; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
  • Conference_Location
    San Antonio, TX
  • Type

    conf

  • DOI
    10.1109/AUTEST.1990.111498
  • Filename
    111498