DocumentCode
2598844
Title
Prediction of Device Reliability by Mechanisms-of-Failure Principles
Author
Ingram, G.E.
Author_Institution
ARINC Research Corporation, Washington, D.C. 20006
fYear
1964
fDate
Sept. 1964
Firstpage
200
Lastpage
209
Abstract
CONSTRUCTION of novel devices for space-age missions requires a new approach to the assessment of reliability of such devices and their components. The method suggested in this paper describes performance characteristics and failure mechanisms of a device in probabilistic terms. Environmental and stress conditions applicable to the device, and its performance and strength characteristics, are expressed in the form of multidimensional probability distributions. By joint evaluation of these probability distributions, a quantitative estimate of the reliability of the device can be obtained.
Keywords
Contacts; Failure analysis; Human factors; Information analysis; Manufacturing processes; Multidimensional systems; Probability distribution; Reliability engineering; Stress; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1964. Third Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1964.362288
Filename
4207642
Link To Document