DocumentCode :
2598854
Title :
A Reliability Predictor for Semiconductor Devices
Author :
Chamow, Martin F.
Author_Institution :
General Electric Company, Re-entry Systems Department, Missile and Space Division, P.O. Box 8555, Philadelphia 1, Pa.
fYear :
1964
fDate :
Sept. 1964
Firstpage :
210
Lastpage :
237
Keywords :
Aerospace electronics; Manufacturing processes; Missiles; Production; Semiconductor device reliability; Semiconductor devices; Space missions; Temperature; Testing; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1964. Third Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1964.362289
Filename :
4207643
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2598854
