• DocumentCode
    2598920
  • Title

    Effect of electrical resistivity on the adhesion and thickness of electrostatically deposited powder layers

  • Author

    Sims, R.A. ; Mazumder, M.K. ; Biris, A.S. ; Sharma, R. ; Kumar, D.

  • Author_Institution
    Appl. Sci. Dept., Arkansas Univ., Little Rock, AR, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    820
  • Abstract
    Control of the charge decay process in an electrostatically-deposited powder layer has an important role in two areas: (1) adhesion of powder to a substrate, and (2) intensity of back corona in the deposited powder layer. If a powder is highly resistive, with resistivity greater than 1013 Ωm, the accumulation of charge on the deposited powder layer often causes back corona, which limits further deposition of powder. However, if the powder has low resistivity, less than 1010 Ωm, the charge decay is rapid enough that back corona does not set in and limit the deposition efficiency. However, at such low resistivity, the adhesion is so weak that the powder may not remain attached to the substrate. The role of resistivity in adhesion of powder to conducting and nonconducting substrates and the management of back corona to allow sufficient film build was studied using powders of different resistivities. Our research shows that charge-to-mass ratio (Q/M) and resistivity must both be taken into account for obtaining the desired film thickness with the necessary adhesion
  • Keywords
    adhesion; corona; electric charge; electrical resistivity; spray coatings; substrates; adhesion; back corona intensity; charge accumulation; charge decay process control; charge-to-mass ratio; conducting substrates; electrical resistivity; electrostatically deposited powder layers; nonconducting substrates; resistivity; thickness; Adhesives; Aluminum; Coatings; Conductivity; Corona; Electric resistance; Polymer films; Powders; Spraying; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
  • Conference_Location
    Rome
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-6401-5
  • Type

    conf

  • DOI
    10.1109/IAS.2000.881925
  • Filename
    881925