Title :
An Investigation of Thin Film Resistor Failure
Author :
Smith, P.C. ; Genser, M.
Author_Institution :
Kearfoot Div., General Precision, Inc., Little Falls, N. J.
Keywords :
Circuit testing; Glass; Life testing; Protection; Resistors; Silicon; Substrates; Temperature; Thin film circuits; Transistors;
Conference_Titel :
Physics of Failure in Electronics, 1964. Third Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1964.362293
