Industrial combining RF and system test of microwave devices using QPSK modulation

Summary form only given, as follows. A VNA is considered as a classical characterization instrument for RF devices but it requires time and expensive equipment. A new method is suggested for RF device industrial test. This procedure is based on EVM system-parameter linked to transmission S-parameter. The test procedure is easier and six times faster than a VNA test. An EVM single value allows knowing the device functionality and a few points describe the RF device characteristics. First tests were done on Butterworth filters of different orders.