Title :
Burn-in temperature projections for deep sub-micron technologies
Author :
Semenov, Oleg ; Vassighi, Annan ; Sachdev, Manoj ; Keshavarzi, Ali ; Hawkins, C.F.
Author_Institution :
University of Waterloo
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
CMOS technology; Clocks; Energy consumption; Frequency; Integrated circuit testing; Leakage current; Microprocessors; Semiconductor device measurement; Temperature measurement; Temperature sensors;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270829
