DocumentCode
2599232
Title
Economics in design and test
Author
Dislis, C. ; Ambler, A.P. ; Dear, I.D. ; Dick, J.H.
Author_Institution
Brunel Univ., Uxbridge, UK
fYear
1993
fDate
3-6 Oct 1993
Firstpage
384
Lastpage
387
Abstract
The issue of economics in design and test is a very troubled and turbulent one. Even amongst our accepted testability experts, there can be widely differing opinions as to the implications of design and test decisions at an economic level, e.g. the continuing debate on full scan vs. partial scan. The paper outlines some of the testability issues facing IC and system designers, especially the costs involved in making circuits testable
Keywords
economics; integrated circuit manufacture; integrated circuit testing; economic level; economics; system designers; testability experts; testability issues; Circuit faults; Circuit testing; Costs; Electronic circuits; Electronic equipment testing; Integrated circuit testing; Manufacturing; Production systems; System testing; Thumb;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on
Conference_Location
Cambridge, MA
Print_ISBN
0-8186-4230-0
Type
conf
DOI
10.1109/ICCD.1993.393347
Filename
393347
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