Title :
The Role of Metallography in the Analysis of Failures of Electronic Components
Author :
Coons, William C.
Author_Institution :
Lockheed Missiles & Space Company, 3251 Hanover Street, Palo Alto, California
Keywords :
Aerospace materials; Circuits; Electron microscopy; Electronic components; Failure analysis; Glass; Laboratories; Missiles; Optical microscopy; Steel;
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1965.362313
