Title :
High-density chain ferroelectric random-access memory (CFRAM)
Author :
Takashima, D. ; Kunishima, I. ; Noguchi, M. ; Takagi, S.
Author_Institution :
ULSIResearch Laboratories, TOSHIBA Corporation
Conference_Titel :
VLSI Circuits, 1997. Digest of Technical Papers., 1997 Symposium on
Print_ISBN :
4-930813-76-X
DOI :
10.1109/VLSIC.1997.623818