An automated multiport measurement system for linear and non-linear characterization of N-port microwave devices

Author

El-Deeb, Walid S ; Boulejfen, Noureddine ; Ghannouchi, Fadhel M.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Calgary, Calgary, AB, Canada

fYear

2009

fDate

5-7 May 2009

Firstpage

1211

Lastpage

1214

Abstract

A measurement system based on microwave transition analyzer (MTA) as a receiver is proposed for time domain and frequency domain characterization of linear and non-linear N-port microwave devices. The proposed measurement system is able to perform full S-parameters characterization for N-port devices with only one measurement connection step. The system is also sensitive to the input power variation without the need of recalibration at each input power level.

Keywords

S-parameters; calibration; microwave measurement; microwave receivers; multiport networks; time-varying networks; N-port microwave device; S-parameter characterization; automated multiport measurement system; frequency domain characterization; microwave receiver; microwave transition analyzer; time domain characterization; Frequency measurement; Microwave devices; Microwave measurements; Performance evaluation; Power measurement; Radio frequency; Scattering parameters; Switches; Switching circuits; Time measurement; Calibration; De-embedding; Linear; Measurments; Microwave; Network analyzer; Non-linear; S-parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE

Conference_Location

Singapore

ISSN

1091-5281

Print_ISBN

978-1-4244-3352-0

Type

conf

DOI

10.1109/IMTC.2009.5168639

Filename

5168639