DocumentCode

2599453

Title

A Limitation to the Step Stress Testing Concept for Integrated Circuits

Author

Shurtleff, W. ; Workman, W.

Author_Institution

Texas Instruments, Inc., Dallas, Texas

fYear

1965

fDate

Nov. 1965

Firstpage

258

Lastpage

278

Keywords

Circuit testing; DH-HEMTs; Hafnium; High definition video; Integrated circuit testing; Stress; TV;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1965.362324

Filename

4207681