Title :
Critical timing analysis in microprocessors using near-ir laser assisted device alteration (lada)
Author :
Rowlette, Jeremy A. ; Eiles, Travis M.
Author_Institution :
Intel Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuits; Frequency synchronization; Isolation technology; Laser modes; Laser theory; Logic gates; Microprocessors; Performance analysis; Physics; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270848
