Title :
Enhanced calibration techniques for VXIbus instrumentation
Author :
Stefenelli, G.J.
Author_Institution :
AAI Corp., Hunt Valley, MD
Abstract :
The author addresses calibration issues of next-generation downsized instrumentation, pointing out that enhancements to traditional calibration techniques need to be investigated and pursued. Hardware and software enhancements to the VXIbus are considered. It is noted in particular that the advent of application-specific integrated circuit technology has allowed the downsizing of conventional test equipment as a first step. But if the ability of an instrument to measure a specified quantity is only as good as how well it is calibrated, then the issue of instrument calibration is one which must be addressed with the same vitality as the initial emphasis on standardizing instrument downsizing
Keywords :
application specific integrated circuits; automatic test equipment; calibration; computer interfaces; electronic equipment testing; standards; VXIbus instrumentation; application-specific integrated circuit technology; calibration; downsized instrumentation; hardware; military equipment; software; Automatic test equipment; Calibration; Hardware; Inspection; Instruments; Manufacturing industries; Performance evaluation; Protocols; Standards development; Test equipment;
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
DOI :
10.1109/AUTEST.1990.111502