Title :
Statistical diagnosis for intermittent scan chain hold-time fault
Author :
Huang, Yu ; Cheng, Wu-Tung ; Reddy, Sudhakar M. ; Hsieh, Cheng-Ju ; Hung, Yu-Ting
Author_Institution :
University of Iowa
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Crosstalk; Delay; Electrons; Fault diagnosis; Probability; Semiconductor device noise; Semiconductor process modeling; Signal design; Timing; Wire;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270854
