DocumentCode

2599565

Title

Statistical diagnosis for intermittent scan chain hold-time fault

Author

Huang, Yu ; Cheng, Wu-Tung ; Reddy, Sudhakar M. ; Hsieh, Cheng-Ju ; Hung, Yu-Ting

Author_Institution

University of Iowa

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

319

Lastpage

328

Keywords

Crosstalk; Delay; Electrons; Fault diagnosis; Probability; Semiconductor device noise; Semiconductor process modeling; Signal design; Timing; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270854

Filename

1270854