• DocumentCode
    2599608
  • Title

    Automatic test case optimization using a bacteriological adaptation model: application to .NET components

  • Author

    Baudry, Benoit ; Fleurey, Franck ; Jezequel, Jean-Marc ; Le Traon, Yues

  • Author_Institution
    IRISA, Rennes, France
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    In this paper, we present several complementary computational intelligence techniques that we explored in the field of .Net component testing. Mutation testing serves as the common backbone for applying classical and new artificial intelligence (AI) algorithms. With mutation tools, we know how to estimate the revealing power of test cases. With AI, we aim at automatically improving test case efficiency. We therefore looked first at genetic algorithms (GA) to solve the problem of test. The aim of the selection process is to generate test cases able to kill as many mutants as possible. We then propose a new AI algorithm that fits better to the test optimization problem, called bacteriological algorithm (BA): BAs behave better that GAs for this problem. However, between GAs and BAs, a family of intermediate algorithms exists: we explore the whole spectrum of these intermediate algorithms to determine whether an algorithm exists that would be more efficient than BAs.: the approaches are compared on a .Net system.
  • Keywords
    automatic testing; genetic algorithms; network operating systems; object-oriented programming; program testing; .Net component testing; AI algorithm; automatic test case optimization; bacteriological adaptation model; bacteriological algorithm; genetic algorithms; mutant killing; mutation testing; selection process; Adaptation model; Artificial intelligence; Automatic testing; Computational intelligence; Computer aided software engineering; Genetic algorithms; Genetic mutations; Robustness; Spine; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automated Software Engineering, 2002. Proceedings. ASE 2002. 17th IEEE International Conference on
  • ISSN
    1938-4300
  • Print_ISBN
    0-7695-1736-6
  • Type

    conf

  • DOI
    10.1109/ASE.2002.1115023
  • Filename
    1115023