• DocumentCode
    2599626
  • Title

    A Simple Technique for the Direct Observation of Temperature Distribution in Microelectronic Structures

  • Author

    Howarth, Donald W.

  • Author_Institution
    Guidance and Control Systems Division, Litton Systems, Incorporated, Woodland Hills, California
  • fYear
    1965
  • fDate
    Nov. 1965
  • Firstpage
    354
  • Lastpage
    366
  • Keywords
    Birefringence; Circuits; Coatings; Crystalline materials; Crystallization; Heat transfer; Microelectronics; Packaging; Power dissipation; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
  • Conference_Location
    Chicago, IL, USA
  • ISSN
    0097-2088
  • Type

    conf

  • DOI
    10.1109/IRPS.1965.362331
  • Filename
    4207688
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2599626