DocumentCode :
2599748
Title :
Fallure Mechanisms Associated with Thermocompression Bonds in Integrated Circuits
Author :
Browning, G.V. ; Colteryahn, L.E. ; Cummings, D.G.
Author_Institution :
Autonetics, A Division of North American Aviation, Inc., Anaheim, California
fYear :
1965
fDate :
Nov. 1965
Firstpage :
428
Lastpage :
446
Keywords :
Chromium; DH-HEMTs; Delta modulation; Indium phosphide; Petroleum;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1965.362338
Filename :
4207695
Link To Document :
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