Title :
Investigation of Surface Failure Mechanisms in Semiconductor Devices by Envelope Ambient Studies
Author :
Brandewie, G.V. ; Eisenberg, P.H. ; Meyer, R.A.
Author_Institution :
Autonetics, a Division of North American Aviation, Inc., Anaheim, California
Keywords :
Failure analysis; Neodymium; Semiconductor devices; Utility programs;
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1965.362341
