• DocumentCode
    2599794
  • Title

    eSYSID: A proposal for a flexible electronic SYStem IDentification test bench

  • Author

    Vandersteen, Gerd ; De Locht, L. ; Schoukens, Johan

  • Author_Institution
    Dept. ELEC, Vrije Univ. Brussel, Brussels, Belgium
  • fYear
    2009
  • fDate
    5-7 May 2009
  • Firstpage
    1309
  • Lastpage
    1314
  • Abstract
    The experimental verification of identification techniques is the ultimate step in showing its qualities and weaknesses. For research purposes, the main problem is the reproduction of measurements done by other groups to validate a new method or excitation. For teaching purposes, on the other hand, it is extremely important that the students can put the system and/or method under study into different configurations. Having a realistic, reproducible and flexible test bench is, however, not an easy mission. This motivates the development of an electronic SYStem IDentification test bench (eSYSID). This paper provides a first architectural study of a digitally-programmable analog test bench. The analog system basically describes the nonlinear state-space equations using nonlinear functions and integrators. The initial architectural structure is described to give the potential users the ability to evaluate the possible use of the test bench. Hence, this paper can be seen as a study of the eSYSID under development, with the intention to gather realistic use-cases from various research groups in the field of instrumentation, measurement and identification.
  • Keywords
    benchmark testing; measurement errors; nonlinear equations; vectors; digitally-programmable analog test bench; eSYSID; flexible electronic system identification; measurements reproduction; nonlinear functions; nonlinear state-space equations; Differential equations; Electronic equipment testing; Flexible electronics; Hardware; Instruments; Nonlinear systems; Particle measurements; Proposals; System identification; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-3352-0
  • Type

    conf

  • DOI
    10.1109/IMTC.2009.5168658
  • Filename
    5168658