Title :
Imperfections and Impurities in Silicon Associated with Device Surface Failure Mechanisms
Author :
Forrester, J.E. ; Harris, R.E. ; Meinhard, J.E. ; Nolder, R.L.
Author_Institution :
Autonetics, a Division of North American Aviation, Inc., Anaheim, California
Keywords :
Chromium; Delta modulation; Failure analysis; Impurities; Silicon;
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1965.362342
