DocumentCode :
2599803
Title :
Imperfections and Impurities in Silicon Associated with Device Surface Failure Mechanisms
Author :
Forrester, J.E. ; Harris, R.E. ; Meinhard, J.E. ; Nolder, R.L.
Author_Institution :
Autonetics, a Division of North American Aviation, Inc., Anaheim, California
fYear :
1965
fDate :
Nov. 1965
Firstpage :
522
Lastpage :
560
Keywords :
Chromium; Delta modulation; Failure analysis; Impurities; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1965.362342
Filename :
4207699
Link To Document :
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