DocumentCode :
2599815
Title :
Accurate amplitude estimation of a sine-wave harmonic component by frequency-domain approach
Author :
Belega, Daniel ; Dallet, Dominique ; Slepicka, David
Author_Institution :
Fac. of Electron. & Telecommun., Politeh. Univ. of Timisoara, Timisoara, Romania
fYear :
2009
fDate :
5-7 May 2009
Firstpage :
1315
Lastpage :
1320
Abstract :
This paper focuses on the amplitude estimation of a sine-wave harmonic component by the Interpolated Discrete Fourier Transform (IpDFT) method with maximum sidelobe decay windows. A constraint is derived ensuring that the influence of systematic errors due to the contribution from fundamental component on the amplitude estimation of a harmonic component can practically be neglected. This constraint permits an optimal choice of the window used. In addition, for a sine-wave corrupted by a stationary white noise, a constraint on the number of acquired samples is derived ensuring accurate estimates of the amplitude of a harmonic component with a high confidence level. Carried out computer simulations confirm the validity of the derived constraints. Finally, the performance of the IpDFT method is compared with the one of the energy-based method on the basis of theoretical and simulations results.
Keywords :
amplitude estimation; discrete Fourier transforms; frequency-domain analysis; harmonic analysis; interpolation; signal sampling; white noise; IpDFT method; accurate amplitude estimation; energy-based method; frequency-domain approach; interpolated discrete Fourier transform; maximum sidelobe decay windows; sine-wave harmonic component; stationary white noise; systematic errors; Amplitude estimation; Computational modeling; Computer errors; Computer simulation; Discrete Fourier transforms; Frequency; Harmonic analysis; Instrumentation and measurement; Laboratories; White noise; amplitude estimation; component; energy-based method; harmonic component; interpolated DFT method; maximum sidelobe decay windows;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
ISSN :
1091-5281
Print_ISBN :
978-1-4244-3352-0
Type :
conf
DOI :
10.1109/IMTC.2009.5168659
Filename :
5168659
Link To Document :
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