• DocumentCode
    2599849
  • Title

    A new approach for low-power scan testing

  • Author

    Yoshida, Takaki ; Watati, Masahmi

  • Author_Institution
    Matsushita Electric Industrial Co., Ltd.
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    480
  • Lastpage
    487
  • Keywords
    Circuit noise; Circuit testing; Clocks; Costs; Large scale integration; Power dissipation; Power supplies; Semiconductor device manufacture; Semiconductor device noise; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270873
  • Filename
    1270873
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2599849