Title :
A new approach for low-power scan testing
Author :
Yoshida, Takaki ; Watati, Masahmi
Author_Institution :
Matsushita Electric Industrial Co., Ltd.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit noise; Circuit testing; Clocks; Costs; Large scale integration; Power dissipation; Power supplies; Semiconductor device manufacture; Semiconductor device noise; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270873
