Title :
Two-stage deadlock prevention policy based on resource-transition circuits
Author :
Han, Libin ; Xing, Keyi ; Zhou, Mengchu ; Liu, Huixia ; Wang, Feng
Author_Institution :
State Key Lab. for Manuf. Syst. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
Abstract :
This paper presents a suboptimal deadlock controller for a class of manufacturing systems of sequential processes with resources, where deadlocks are characterized by saturated maximal perfect resource-transition circuits (MPRT-circuits), and the controller consists of two parts. In the maximally permissive Petri net controller, which avoids all MPRT-circuits being saturated, some control places are redundant. By deleting all redundant control places and their related arcs, the first part of our controller, non-redundant controller, is obtained. In the controlled system with the non-redundant controller, deadlocks may occur if the system contains crucial resources. Then we propose for the first time the concept of the maximal perfect control-transition circuits (MPCT-circuits), which is used to characterize the deadlock in the controlled system with the non-redundant controller. When deadlock occurs under a reachable marking, some MPCT-circuits in the controlled system become empty. The Petri net controller to prevent all MPCT-circuits from being empty is the second part of our controller. It is proved that the controller consisting of two parts can guarantee the liveness of the controlled system.
Keywords :
Petri nets; flexible manufacturing systems; redundancy; suboptimal control; MPRT-circuits; flexible manufacturing systems; maximally permissive Petri net controller; nonredundant controller; redundant control places; resource-transition circuits; saturated maximal perfect resource-transition circuits; sequential processes; suboptimal deadlock controller; two-stage deadlock prevention policy; Complexity theory; Control systems; Manufacturing systems; Nickel; Petri nets; Process control; System recovery;
Conference_Titel :
Automation Science and Engineering (CASE), 2012 IEEE International Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0429-0
DOI :
10.1109/CoASE.2012.6386305