DocumentCode :
2599949
Title :
VXI ATE technology
Author :
Cascia, David La
Author_Institution :
SEMCO, Carlsbad, CA, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
137
Lastpage :
144
Abstract :
Two VXI test sets are described. One is portable in the literal sense of the word, the other is transportable rather than portable. Each VXI card cage contains up to 13 instruments, including an onboard computer, in an area not much larger than two PCs stacked on top of each other. The capability of the portable tester rivals that of existing two- and three-rack ATE (automatic test equipment) and far exceeds the speed. The smaller ATE contains more capability than the Hybrid Test Set or CATIII stations built ten years earlier. With the addition of a half-size instrumentation rack, RF testing becomes available. This rack will include power meters, synthesizers, and spectrum analyzers. Block diagrams of both the flightline and depot-level test set block diagrams are presented
Keywords :
automatic test equipment; computer interfaces; computerised instrumentation; electronic equipment testing; portable instruments; RF testing; VXI ATE technology; VXI card cage; depot-level test set; flightline; portable instruments; power meters; spectrum analyzers; synthesizers; three-rack ATE; transportable instruments; two-rack ATE; Automatic test equipment; Backplanes; Bandwidth; Digital signal processing; Engineering management; Instruments; Military computing; Personal communication networks; Systems engineering and theory; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111504
Filename :
111504
Link To Document :
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