VXI ATE technology

Author

Cascia, David La

Author_Institution

SEMCO, Carlsbad, CA, USA

fYear

1990

fDate

17-21 Sep 1990

Firstpage

137

Lastpage

144

Abstract

Two VXI test sets are described. One is portable in the literal sense of the word, the other is transportable rather than portable. Each VXI card cage contains up to 13 instruments, including an onboard computer, in an area not much larger than two PCs stacked on top of each other. The capability of the portable tester rivals that of existing two- and three-rack ATE (automatic test equipment) and far exceeds the speed. The smaller ATE contains more capability than the Hybrid Test Set or CATIII stations built ten years earlier. With the addition of a half-size instrumentation rack, RF testing becomes available. This rack will include power meters, synthesizers, and spectrum analyzers. Block diagrams of both the flightline and depot-level test set block diagrams are presented

Keywords

automatic test equipment; computer interfaces; computerised instrumentation; electronic equipment testing; portable instruments; RF testing; VXI ATE technology; VXI card cage; depot-level test set; flightline; portable instruments; power meters; spectrum analyzers; synthesizers; three-rack ATE; transportable instruments; two-rack ATE; Automatic test equipment; Backplanes; Bandwidth; Digital signal processing; Engineering management; Instruments; Military computing; Personal communication networks; Systems engineering and theory; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.

Conference_Location

San Antonio, TX

Type

conf

DOI

10.1109/AUTEST.1990.111504

Filename

111504