DocumentCode
2600036
Title
Combining ATE and flying probe in-circuit test strategies for load board verification and test
Author
Soh Ying Seah ; Ooi, Melanie Po-Leen ; Ye Chow Kuang ; Chee Sun See ; Panchadcharam, Shanti ; Demidenko, Serge
Author_Institution
Sch. of Eng., Monash Univ., Bandar Sunway, Malaysia
fYear
2009
fDate
5-7 May 2009
Firstpage
1380
Lastpage
1385
Abstract
Load board verification is normally performed by IC manufacturers on an automatic test equipment (ATE) as per of the standard test procedure prior to final test. Since test load boards are used as an interface between the automatic test equipment (ATE) and integrated circuit (IC), it is thus important to ensure that a particular load board is functioning otherwise the test integrity of all IC tested using the board will be questionable. As load boards become increasingly complex and difficult to verify accurately, IC manufacturers may need to use in-circuit testing as an addition to load board verification. Traditional in-circuit test platforms are expensive to implement due to cost in the bed-of-nails fixture. With the introduction of flying-probe in-circuit test platforms, this option is now a cost-viable solution. This paper discusses the issues that surround the combined test strategy of flying-probe in-circuit test and load board verification on an ATE. It goes on to propose a structure test strategy to combine both test platforms. Finally, the results and discussion are presented.
Keywords
automatic test equipment; integrated circuit manufacture; integrated circuit testing; ATE; IC manufacturer; automatic test equipment; flying probe in-circuit test strategy; integrated circuit testing; load board verification; Automatic test equipment; Automatic testing; Circuit faults; Circuit testing; Fault detection; Fixtures; Integrated circuit testing; Manufacturing; Performance evaluation; Probes; automatic test equipment; flying probe; in-circuit testing; load board; verification;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location
Singapore
ISSN
1091-5281
Print_ISBN
978-1-4244-3352-0
Type
conf
DOI
10.1109/IMTC.2009.5168671
Filename
5168671
Link To Document