Title :
X-tolerant compression and application of scan-atpg patterns in a bist architecture
Author :
Wohl, Peter ; Waicukauski, John A. ; Patel, Sanjay ; Amin, Minesh B.
Author_Institution :
Synopsys Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic logic units; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit testing; Costs; Design for testability; Logic devices; Logic testing; Test pattern generators;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270902
