DocumentCode
2600393
Title
Studies of the Uniformity of Avalanche Breakdown by Means of Low Frequency Noise Measurements
Author
Haitz, Roland H.
Author_Institution
Texas Instruments Incorporated, Dalles, Texas
fYear
1966
fDate
Nov. 1966
Firstpage
447
Lastpage
461
Abstract
The correlation between low frequency noise and the uniformity of the current distribution in avalanche diodes is investigated. It is found that small diodes with a uniform current distribution obey the theoretically predicted relation u2/¿f=a2Vb2/I with a2 = 4.8·10¿20 A/Hz. Larger diodes exhibit excess noise above the theoretically predicted minimum noise. The origin of this excess noise is traced to nonuniformities of the breakdown voltage across the avalanche junction. To characterize the uniformity of breakdown we have defined four quantities which can be determined readily from noise and impedance vs current characteristics. These four quantities are: (1) the number of noise peaks N; (2) the maximum noise figure F*AD; (3) the relative breakdown voltage spread ¿Vb/Vb; and (4) the impedance ratior r. The correlation between these quantities and the uniformity of avalanche breakdown is demonstrated on a series of alloyed, planar, and guard ring diodes.
Keywords
Avalanche breakdown; Current distribution; Diodes; Electric breakdown; Frequency measurement; Impedance; Low-frequency noise; Noise figure; Noise measurement; Signal to noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1966. Fifth Annual Symposium on the
Conference_Location
Columbus, OH, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1966.362378
Filename
4207738
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