• DocumentCode
    2600393
  • Title

    Studies of the Uniformity of Avalanche Breakdown by Means of Low Frequency Noise Measurements

  • Author

    Haitz, Roland H.

  • Author_Institution
    Texas Instruments Incorporated, Dalles, Texas
  • fYear
    1966
  • fDate
    Nov. 1966
  • Firstpage
    447
  • Lastpage
    461
  • Abstract
    The correlation between low frequency noise and the uniformity of the current distribution in avalanche diodes is investigated. It is found that small diodes with a uniform current distribution obey the theoretically predicted relation u2/¿f=a2Vb2/I with a2 = 4.8·10¿20 A/Hz. Larger diodes exhibit excess noise above the theoretically predicted minimum noise. The origin of this excess noise is traced to nonuniformities of the breakdown voltage across the avalanche junction. To characterize the uniformity of breakdown we have defined four quantities which can be determined readily from noise and impedance vs current characteristics. These four quantities are: (1) the number of noise peaks N; (2) the maximum noise figure F*AD; (3) the relative breakdown voltage spread ¿Vb/Vb; and (4) the impedance ratior r. The correlation between these quantities and the uniformity of avalanche breakdown is demonstrated on a series of alloyed, planar, and guard ring diodes.
  • Keywords
    Avalanche breakdown; Current distribution; Diodes; Electric breakdown; Frequency measurement; Impedance; Low-frequency noise; Noise figure; Noise measurement; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Failure in Electronics, 1966. Fifth Annual Symposium on the
  • Conference_Location
    Columbus, OH, USA
  • ISSN
    0097-2088
  • Type

    conf

  • DOI
    10.1109/IRPS.1966.362378
  • Filename
    4207738