Title :
Failure Mechanisms and Device Reliability
Author :
Smith, J.S. ; Vaccaro, J.
Author_Institution :
Rome Air Development Center, Griffiss Air Force Base, New York 13440
Abstract :
This paper shows how expressions for failure mechanisms may be derived and related to device reliability. The necessary conditions and limitations of such relations are examined, and their applicability to practical device reliability problems is assessed. The role of the reliability physicist in furnishing needed information and understanding at the mechanism level is indicated.
Keywords :
Chemical analysis; Degradation; Failure analysis; Kinetic theory; Laboratories; Physics; Reliability engineering; Solids; Space technology; Testing;
Conference_Titel :
Reliability Physics Symposium, 1967. Sixth Annual
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/IRPS.1967.362387
