• DocumentCode
    2600593
  • Title

    Failure Mechanisms and Device Reliability

  • Author

    Smith, J.S. ; Vaccaro, J.

  • Author_Institution
    Rome Air Development Center, Griffiss Air Force Base, New York 13440
  • fYear
    1967
  • fDate
    Nov. 1967
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper shows how expressions for failure mechanisms may be derived and related to device reliability. The necessary conditions and limitations of such relations are examined, and their applicability to practical device reliability problems is assessed. The role of the reliability physicist in furnishing needed information and understanding at the mechanism level is indicated.
  • Keywords
    Chemical analysis; Degradation; Failure analysis; Kinetic theory; Laboratories; Physics; Reliability engineering; Solids; Space technology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1967. Sixth Annual
  • Conference_Location
    Los Angeles, CA, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1967.362387
  • Filename
    4207750
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2600593