Title :
The Impact of the Flight Specifications on Semiconductor Failure Rates
Author :
Partridge, Jayne ; Hanley, L.David
Author_Institution :
Instrumentation Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts
Abstract :
The procurement, screen and burn-in, and field history of the semiconductor parts in the Apollo Guidance Computer (AGC) is given. Both field failures and variability of performance through screen and burn-in are directly related to changes occurring in the parts manufacturer´s facilities. The problems of developing and sustaining high reliability are discussed.
Keywords :
Circuit testing; History; Instruments; Integrated circuit reliability; Laboratories; Manufacturing processes; Military computing; Process control; Procurement; Space technology;
Conference_Titel :
Reliability Physics Symposium, 1967. Sixth Annual
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/IRPS.1967.362390
