DocumentCode
2600839
Title
Automatic generation of load tests
Author
Zhang, Pingyu ; Elbaum, Sebastian ; Dwyer, Matthew B.
Author_Institution
Univ. of Nebraska - Lincoln, Lincoln, NE, USA
fYear
2011
fDate
6-10 Nov. 2011
Firstpage
43
Lastpage
52
Abstract
Load tests aim to validate whether system performance is acceptable under peak conditions. Existing test generation techniques induce load by increasing the size or rate of the input. Ignoring the particular input values, however, may lead to test suites that grossly mischaracterize a system´s performance. To address this limitation we introduce a mixed symbolic execution based approach that is unique in how it 1) favors program paths associated with a performance measure of interest, 2) operates in an iterative-deepening beam-search fashion to discard paths that are unlikely to lead to high-load tests, and 3) generates a test suite of a given size and level of diversity. An assessment of the approach shows it generates test suites that induce program response times and memory consumption several times worse than the compared alternatives, it scales to large and complex inputs, and it exposes a diversity of resource consuming program behavior.
Keywords
automatic test pattern generation; iterative methods; program testing; symbol manipulation; automatic test generation technique; iterative-deepening beam search fashion; load test; memory consumption; mixed symbolic execution based approach; program path; program response time; resource consuming program behavior; system performance; Current measurement; Databases; Memory management; Servers; Size measurement; Testing; Time factors; Load testing; symbolic execution;
fLanguage
English
Publisher
ieee
Conference_Titel
Automated Software Engineering (ASE), 2011 26th IEEE/ACM International Conference on
Conference_Location
Lawrence, KS
ISSN
1938-4300
Print_ISBN
978-1-4577-1638-6
Type
conf
DOI
10.1109/ASE.2011.6100093
Filename
6100093
Link To Document