DocumentCode :
2600973
Title :
Extending the Life of Chromium-Silver Metallization on Silicon Devices
Author :
Ross, E.C. ; Wallmark, J.T.
Author_Institution :
RCA Laboratories, Radio Corporation of America, Princeton, New Jersey
fYear :
1967
fDate :
Nov. 1967
Firstpage :
160
Lastpage :
165
Keywords :
Chromium; Conductivity; Contact resistance; Electrical resistance measurement; Metallization; Ohmic contacts; Silicon devices; Silver; Strips; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1967. Sixth Annual
Conference_Location :
Los Angeles, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1967.362409
Filename :
4207772
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2600973
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