DocumentCode

2600987

Title

Causal Basis for System Failure Rate Calculations

Author

Stewart, R.G.

Author_Institution

Lockheed Palo Alto Research Laboratory, Palo Alto, California 94304

fYear

1967

fDate

Nov. 1967

Firstpage

166

Lastpage

169

Keywords

Arithmetic; Circuits and systems; Degradation; Exponential distribution; Feedback; Hazards; Laboratories; Reliability theory; Stress; Time factors;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1967. Sixth Annual

Conference_Location

Los Angeles, CA, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1967.362410

Filename

4207773