Title :
Independent component analysis of the interface fluctuations of gas/liquid two-phase flow
Author :
YanBin Xu ; Huaxiang Wang ; Ziqiang Cui ; Feng Dong ; Yong Yan
Author_Institution :
Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China
Abstract :
It is important to study the interface fluctuations between the two phases in a gas/liquid flow to achieve an in-depth understanding of the mixture flow and subsequent optimization of industrial processes. This paper presents a study of the interface fluctuations between the gas and liquid phases in a pipeline. Experimental data are obtained from a gas/liquid two-phase flow rig through electrical resistance tomography (ERT). Independent component analysis (ICA) methods are applied not only to extract the flow regime information from the data but also the interface fluctuation of the flow. The efficiency of the ICA method with the ERT data has been assessed by experiments. The independent components have been interpreted by comparing them with the reconstructed images by ERT. The comparative studies have shown that ICA is effective in extracting the interface fluctuation of gas/liquid two-phase flow with weak coupling between two phases, especially for stratified flow and slug flow. Without the need of modelling the forward problem, this method can be applied to other electrical tomography modalities.
Keywords :
electric resistance measurement; feature extraction; flow visualisation; image reconstruction; independent component analysis; interface phenomena; pipe flow; pipelines; stratified flow; tomography; two-phase flow; electrical resistance tomography; flow regime information extraction; forward problem; gas two-phase flow; image reconstruction; independent component analysis; industrial process optimization; interface fluctuation; liquid two-phase flow; pipeline; stratified flow; Data mining; Electric resistance; Electrodes; Fluctuations; Fluid flow; Image reconstruction; Independent component analysis; Magnetic sensors; Pipelines; Tomography; Electrical resistance tomography; Independent component analysis; Interface fluctuation; Two-phase flow;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168735