• DocumentCode
    2601318
  • Title

    Ring artifacts reduction in cone-beam CT images based on independent component analysis

  • Author

    Yen-Wei Chen ; Guifang Duan ; Fujita, Akihito ; Hirooka, Ken ; Ueno, Yukiko

  • Author_Institution
    Elect & Inf. Eng. Sch., Central South Univ. of Forest & Tech., Changsha, China
  • fYear
    2009
  • fDate
    5-7 May 2009
  • Firstpage
    1734
  • Lastpage
    1737
  • Abstract
    Cone-beam CT (CBCT) scanners are based on volumetric tomography, using a 2D extended digital array providing an area detector [1]. Compared to traditional CT, CBCT has many advantages, such as less X-ray beam limitation, high image accuracy, rapid scan time, etc. However, in CBCT images there are always some ring artifacts that appear as rings centered on the rotation axis. Due to the data of the constructed images are corrupted by these ring artifacts, qualitative and quantitative analysis of CBCT images will be compromised. Post processing and application such as image segmentation and registration also turn more complex as the presence of such artifacts. In this paper, a method based on independent component analysis (ICA) is presented. It deals with the reconstructed CBCT image and can effectively reduce such ring artifacts.
  • Keywords
    computerised tomography; diagnostic radiography; image reconstruction; image registration; image scanners; image segmentation; independent component analysis; medical image processing; 2D extended digital array; cone-beam CT scanner; image reconstruction; image registration; image segmentation; independent component analysis; qualitative analysis; quantitative analysis; ring artifacts reduction; volumetric tomography; Computed tomography; Detectors; Digital filters; Filtering; Image analysis; Image reconstruction; Independent component analysis; Sensor arrays; Smoothing methods; X-ray imaging; CBCT image; Independent component analysis (ICA); Mean filter; Ring artifact reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-3352-0
  • Type

    conf

  • DOI
    10.1109/IMTC.2009.5168737
  • Filename
    5168737