Title :
Plastic IC Reliability Evaluation and Analysis
Author :
Bevington, J.R. ; Cook, J.P. ; Little, D.R.
Author_Institution :
Delco Radio Division, General Motors Corporation, Kokomo, Indiana
Keywords :
Coatings; Electric shock; Gold; Integrated circuit reliability; Lead; Logic circuits; Manufacturing; Packaging; Plastics; Silicon compounds;
Conference_Titel :
Reliability Physics Symposium, 1970. 8th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1970.362438
