DocumentCode
2601530
Title
"Moisture Resistance of Plastic Packages for Semiconductor Devices"
Author
Fischer, F.
Author_Institution
Siemens AG, Bereich Halbleiter, D 8 Mÿnchen 80, Ba¿anstrasse 73
fYear
1970
fDate
25659
Firstpage
94
Lastpage
100
Abstract
The influence of processing on the moisture resistance of epoxies and silicones used for packaging semiconductor devices is investigated. Conditions are assumed analogou to a capacitor charging up through a series resistance, and it is shown that this model applies with sufficient accuracy for optimally processed plastic compounds. Deviations indicate incorrect procecsing. Based on the model, characteristic values for moisture permeability and moisture capacity are defined and their variations with the processing conditions discussed. It is shown how the moisture capacity and moisture resistance influence semiconductor devices, and the relationship between moisture parameters and other characteristic values of the plastic is indicated.
Keywords
Absorption; Capacitors; Circuit testing; Materials reliability; Moisture; Permeability; Plastic packaging; Semiconductor device packaging; Semiconductor devices; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1970. 8th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1970.362440
Filename
4207806
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