Title :
Integrated Circuits & Manufacturing - DRAM and Fuse Technology
Author :
Matsui, Yuichi ; Hamamoto, Takeshi
Author_Institution :
Hitachi
Keywords :
Fuses; Integrated circuit manufacture; Integrated circuit technology; National electric code; Parasitic capacitance; Random access memory; Read-write memory; Transistors;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4418853
