DocumentCode

2601533

Title

Integrated Circuits & Manufacturing - DRAM and Fuse Technology

Author

Matsui, Yuichi ; Hamamoto, Takeshi

Author_Institution

Hitachi

fYear

2007

fDate

10-12 Dec. 2007

Firstpage

25

Lastpage

25

Keywords

Fuses; Integrated circuit manufacture; Integrated circuit technology; National electric code; Parasitic capacitance; Random access memory; Read-write memory; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 2007. IEDM 2007. IEEE International

Conference_Location

Washington, DC

Print_ISBN

978-1-4244-1507-6

Electronic_ISBN

978-1-4244-1508-3

Type

conf

DOI

10.1109/IEDM.2007.4418853

Filename

4418853