Title :
High performance Silicon-On-ONO (SOONO) Cell Array Transistors (SCATs) for 512Mb DRAM Cell Array Application
Author :
Kim, Sung Hwan ; Bae, Hyun Jun ; Hong, Sung In ; Choi, Yong Lack ; Yoon, Eun Jung ; Song, Ho Ju ; Oh, Chang Woo ; Lee, Yong-Seok ; Cho, Hong ; Kim, Dong-Won ; Park, Donggun ; Lee, Won-Seong
Author_Institution :
Samsung Electron. Co., Yongin
Abstract :
As DRAM cell pitch size scales, the DRAM cells have required characteristics of high performance transistors. In this paper, we proposed and successfully demonstrated high performance silicon-on-ONO (SOONO) cell array transistors (SCATs) for 512Mb DRAM cell array application. They have advantages of SOI substrate and 3-D hi-gate as well as process simplicity. From those advantages, they have low Ioff due to good SCE immunity with DIBL of 40 mV/V and SS of 84 mV/dec, low GIDL current, low junction leakage current, and low junction capacitance as well as no body bias dependence. Thus, the SCATs may be a promising solution satisfying the requirements of DRAM cells with scaling.
Keywords :
DRAM chips; leakage currents; silicon-on-insulator; 3D hi gate; DRAM cell array application; SOI substrate; low junction capacitance; low junction leakage current; silicon on ONO cell array transistors; Capacitance; Character generation; Current measurement; Electric variables; FinFETs; Immune system; Leakage current; Random access memory; Scalability; Transistors;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4418856