DocumentCode :
2601726
Title :
Can the storage capacity of memories built from unreliable components be determined?
Author :
Chilappagari, Shashi Kiran ; Vasic, Bane ; Marcellin, Michael
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ
fYear :
2008
fDate :
Jan. 27 2008-Feb. 1 2008
Firstpage :
41
Lastpage :
43
Abstract :
A memory is a device in which information is stored at some time and retrieved at a later time . Let the information be stored in form of bits in registers (memory elements) each of which can store a single bit. The information storage capability of a memory is the number of information bits it stores. Building a memory with information storage capability of k bits with reliable memory elements requires k registers. Such a memory is termed as an irredundant memory. This paper considers the problem of building a memory with memory elements and logic gates which fail according to a known random mechanism. The required minimum redundancy memory in which makes arbitrarily reliable information possible is discussed. For a reliable storage, the information needs to be stored in coded form . To ensure reliability, a correcting circuit is employed which performs error correction and updates the contents of the registers with an estimate of the original codeword.
Keywords :
error correction codes; fault tolerant computing; logic gates; storage management chips; codeword; correcting circuit; error correction; information storage; logic gates; reliability; storage capacity; unreliable memory elements; Circuit faults; Electromagnetic transients; Error correction codes; Failure analysis; Iterative decoding; Logic gates; Parity check codes; Redundancy; Registers; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory and Applications Workshop, 2008
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2670-6
Type :
conf
DOI :
10.1109/ITA.2008.4601020
Filename :
4601020
Link To Document :
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