DocumentCode
2601733
Title
Lead Bonding Techniques and Physics of Failure Considerations
Author
Lesk, I.A. ; Black, J.R.
Author_Institution
Motorola Semiconductor Products Division, Phoenix, Arizona
fYear
1970
fDate
25659
Firstpage
161
Lastpage
162
Abstract
The areas in which perhaps most is at stake concerning economy and reliability of semiconductor components is that of attaching devices and integrated circuits into packages. The most common situation involves a single component, per package, although multi-component encapsulation and hybrid integrated circuits represent rapidly growing fields. A great many bonding techniques and geometries have evolved and are in use today--thermocompression and ultrasonic wire bonding (wedge and ball), welding, soldering, eutectic brazing, organic adhesion, flip chip bonding (solder and ultrasonic), beam lead, and spider. From the standpoint of reliability physics, the number of problems inherent in this multiplicity of bonding techniques is considerably expanded by the number of materials commonly utilized with each technique, and by the variety of package environments that are in use. All of this is further modified by the controls exercised on bonding and packaging during manufacture.
Keywords
Bonding; Encapsulation; Hybrid integrated circuits; Integrated circuit packaging; Integrated circuit reliability; Joining processes; Lead; Physics; Semiconductor device packaging; Semiconductor device reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1970. 8th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1970.362452
Filename
4207818
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