DocumentCode :
2601782
Title :
Factors in High Reliability Wire Bonding
Author :
Davis, Dan
Author_Institution :
Research and Development Laboratory, Fairchild Camera and Instrument Corporation, Palo Alto, California 94304
fYear :
1970
fDate :
25659
Firstpage :
170
Lastpage :
176
Abstract :
The production of devices with highest reliability is the result of optimum specifications on equipment and piece parts together with a process which has been selected from knowledge of how the operating variables affect the bond. This knowledge must be developed on each bonding system by a series of test samples, with suitable curves developed, which enable the engineer to select the process.
Keywords :
Bonding; Cameras; Contracts; Electric shock; Instruments; Knowledge engineering; Laboratories; Production; System testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1970. 8th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1970.362454
Filename :
4207820
Link To Document :
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