Title :
RC-SCR: a novel low-voltage ESD protection circuit with new triggering mechanism
Author :
Feng, H. ; Zhan, R. ; Wu, Q. ; Chen, G. ; Guan, X. ; Wang, Albert Z.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
Several techniques exist to realize low triggering of SCR (Si-controlled rectifier) ESD (electrostatic discharging) protection structures in CMOS technologies. This paper reports a novel RC-SCR (RC-coupled SCR) ESD protection circuit using a new RC-coupling-based triggering mechanism to further reduce triggering voltage. Implementation in a commercial 0.35μm CMOS process results in a very low triggering of 7V, representing a 28% further reduction from existing low-triggering-voltage SCR ESD protection designs.
Keywords :
CMOS integrated circuits; electrostatic discharge; integrated circuit reliability; low-power electronics; protection; trigger circuits; 0.35 micron; 7 V; CMOS; ESD-induced failure; IC reliability; RC-SCR; RC-coupled SCR; low-voltage ESD protection circuit; triggering mechanism; triggering voltage; Biological system modeling; Breakdown voltage; CMOS technology; Circuit simulation; Clamps; Electrostatic discharge; Integrated circuit technology; Protection; Radio frequency; Thyristors;
Conference_Titel :
Circuits and Systems, 2002. APCCAS '02. 2002 Asia-Pacific Conference on
Print_ISBN :
0-7803-7690-0
DOI :
10.1109/APCCAS.2002.1115133
