Title :
Simultaneous image segmentation and 3D plane fitting for RGB-D sensors — An iterative framework
Author :
Guan, Li ; Yu, Ting ; Tu, Peter ; Lim, Ser-Nam
Author_Institution :
GE Global Res., Niskayuna, NY, USA
Abstract :
In this paper, we segment RGB-D sensor (e.g. Microsoft Kinect camera) images into 3D planar surfaces. We initialize a set of plane equations based solely from the depth (point cloud) information. We then iteratively refine the pixel-to-plane assignment and plane equations. During this process, the number of planes are also reduced by merging adjacent local planes with similar orientations. For the pixel-to-plane assignment, we treat the image as a Markov Random Field (MRF), and solve the association problem using graph-based global energy minimization. We design the energy terms to encapsulate both appearance cues from the RGB (color) channels and shape cues from the D (depth) channel. Experiments show that the use of both appearance and geometry information significantly improves the segmentation quality, especially so at genuine plane edges and plane intersections. As a byproduct, the framework also automatically fills in missing depth information.
Keywords :
Markov processes; curve fitting; graph theory; image colour analysis; image segmentation; image sensors; iterative methods; random processes; 3D plane fitting; D depth channel; MRF; Markov random field; Microsoft Kinect camera image segmentation; RGB color channels; RGB-D sensor image segmentation; appearance cues; appearance information; association problem; depth information; depth point cloud information; geometry information; graph-based global energy minimization; iterative methods; local planes; pixel-to-plane assignment; plane edges; plane equations; plane intersections; segmentation quality improvement; shape cues; Cameras; Equations; Image color analysis; Image edge detection; Image segmentation; Mathematical model; Sensors;
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2012 IEEE Computer Society Conference on
Conference_Location :
Providence, RI
Print_ISBN :
978-1-4673-1611-8
Electronic_ISBN :
2160-7508
DOI :
10.1109/CVPRW.2012.6238914