Title :
Extraction of critical areas for opens in large VLSI circuits
Author :
Ouyang, Charles H. ; Pleskacz, Witold A. ; Maly, Wojciech
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This paper describes a new algorithm for the extraction of the critical area for opens. The presented algorithm allows for the analysis of large ICs and non-Manhattan geometry. Concept of the contact/via contacting regions is proposed and its relevance is discussed. Illustrative examples of the proposed algorithm are presented
Keywords :
VLSI; fault location; integrated circuit testing; VLSI circuit; contact regions; critical areas; extraction algorithm; large IC; nonManhattan geometry; opens; via contacting regions; Algorithm design and analysis; Conducting materials; Contacts; Geometry; Insulation; Integrated circuit interconnections; Manufacturing; Modems; Very large scale integration; Yield estimation;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
0-8186-7545-4
DOI :
10.1109/DFTVS.1996.571981
