Title :
A Class of Byte Error Control Codes for Memory Systems - Sbec-(sb+s)ed Codes
Author :
Hamada, Mitsuru ; Fujiwara, Eiji
Author_Institution :
Tokyo Institute of Technology, Japan
Keywords :
Computer errors; Computer science; Error correction; Error correction codes; Hamming weight; Linear code; Parity check codes; Protection; Semiconductor memory; Vectors;
Conference_Titel :
Information Theory, 1993. Proceedings. 1993 IEEE International Symposium on
Print_ISBN :
0-7803-0878-6
DOI :
10.1109/ISIT.1993.748558